Piezo Flexure Mechanic stages provide high speed, nanometer resolution and high accuracy. They are used for applications requiring precision motion in one or more degrees of freedom. PI is the global leader in design and manufacture of piezoelectric nanopositioning and scanning stages. Advantages of PI Piezo Stage systems are: frictionless flexure designs, parallel kinematics (better multiaxis trajectory control), parallel metrology (keeps motion of all controlled axes inside the servo loop), capacitive feedback (direct measuring, non contact), digital control (wider dynamic range, better linearity, autocalibration…). |
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P-712 Low-Profile OEM Piezo Scanner | ||
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P-752 Piezo NanoAutomation® Stages with Direct Metrology | ||
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P-753 LISA Piezo NanoAutomation® Stages / Actuators with Direct Metrology | ||
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P-750 High-Load Piezo-Driven Nanopositioning Stages with Direct Metrology | ||
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P-601 High-Precision Lever Amplified Z-Actuator with Flexure Guiding | ||
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P-602 Flexure Actuator with High Stiffness. Integrated Guiding System, High Force and Large Travel Ranges | ||
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P-603 Linear Actuator: Low-cost and with Large Travel Ranges | ||
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P-620.Z · P-621.Z · P-622.Z PIHera Piezo-Z Nanopositioning Stages with Direct Metrology | ||
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P-737 PIFOC® Z-Axis Microscopy Piezo Stage for High-Resolution Sample Positioning and Scanning | ||
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P-545 PInano™ XY & XYZ 1x3 Piezo Stage Systems | ||
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Piezo Stage Datasheet | Download the Tools for Microscopy Catalog | Controller Manual | Request Quote |

P-612 Compact Piezo Elevation Stage with Aperture | ||
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P-541.ZSL Low-Profile Z/Tip/Tilt Piezo Nanopositioner Stages for Microscopy | ||
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P-541.ZCD Low-Profile Z/Tip/Tilt Piezo Nanopositioner Stages for Microscopy with Parallel Metrology | ||
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P-528 Z/Tip/Tilt Flexure Nanopositioning / Scanning Piezo Stages with Parallel Metrology | ||
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P-721 PIFOC Nanopositioning Stage for Objective Focusing with Direct Metrology | ||
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P-725 PIFOC Nanopositioning Stage for Objective Focusing | Long-Travel Z-Drives, Direct Metrology | ||
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P-611.1 · P-611.2 Compact X and XY Piezoelectric Nanopositioning Systems | ||
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P-620.2 - P-629.2 PIHera Long-Range XY Piezo Nanopositioner Stages with Direct Metrology | ||
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P-363 PicoCube® High-Speed, XY(Z) Piezo Stages for Nanotechnology, SPM, AFM | ||
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P-611.3S · P-611.3O NanoCube® XYZ Nanopositioning Piezo System | ||
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P-612.2 Compact XY Piezo-Nanopositioner with Aperture | ||
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P-541.2SL Low-Profile, Parallel-Kinematics XY Piezo Stages for Scanning Microscopy | ||
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P-542.2CD Low-Profile, Scanning Microscopy XY Piezo Stages with Parallel Metrology | ||
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P-733 Ultra-High-Speed, XY / XYZ Scanning Microscopy Stages with Parallel Metrology | ||
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P-733 XY Piezo Nanopositioning / Scanning Stages With Parallel Metrology | ||
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P-734 Ultra-Precision Trajectory, XY Nanopositioning Stages with Parallel Metrology | ||
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P-517 · P-527 Multi-Axis, Piezo Nanopositioning / Scanning Stages with Parallel Metrology | ||
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P-615 NanoCube® XYZ Piezo Nano Alignment Systemillisec with Parallel Metrology | ||
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P-562 PIMarsTM XYZ Piezo Stages / Scanners with Parallel Metrology | ||
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P-545 PInano XY & XYZ 1x3 Piezo Stage Systems | ||
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Piezo Stage Datasheet |

P-587 Six-Axis, Long-Travel Piezo Stage Nanopositioner with Parallel Metrology | ||
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P-772 Ultra-Compact Piezo Stage NanoAutomation® System with Direct Metrology | ||
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| Piezo-Motor-Driven Stages |
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